ALEXANDRIA, Va., Sept. 17 -- United States Patent no. 12,417,813, issued on Sept. 16, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Gyeonggi-Do, South Korea).
"Memory device for outputting test results" was invented by Jongpil Son (Suwon-si, South Korea).
According to the abstract* released by the U.S. Patent & Trademark Office: "A memory device includes a memory cell array and a repair circuit configured to perform a repair operation and output a dirty signal to an external destination external to the memory device. The repair circuit further performs selecting a first redundancy address of the redundancy memory cells instead of a first fail address of the first failed memory cell, storing a first redundancy mapping for the first fail ad...