ALEXANDRIA, Va., Oct. 8 -- United States Patent no. 12,439,607, issued on Oct. 7, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea).
"Inspection device" was invented by Kenji Suzuki (Yokohama, Japan), Ingi Kim (Suwon-si, South Korea), Mitsunori Numata (Yokohama, Japan), Shinji Ueyama (Yokohama, Japan) and Tomoki Onishi (Yokohama, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "An inspection device improves accuracy characteristics of an (MRAM), the inspection device including a stage on which a MRAM element is fixed, and electromagnets generating a first magnetic field. A magnetic field having a component in a direction perpendicular to the stage is changeable from a first direction t...