ALEXANDRIA, Va., Oct. 28 -- United States Patent no. 12,455,228, issued on Oct. 28, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea).
"Semiconductor measurement apparatus" was invented by Garam Choi (Suwon-si, South Korea), Wookrae Kim (Suwon-si, South Korea), Jinseob Kim (Suwon-si, South Korea), Jinyong Kim (Suwon-si, South Korea), Sungho Jang (Suwon-si, South Korea) and Daehoon Han (Suwon-si, South Korea).
According to the abstract* released by the U.S. Patent & Trademark Office: "A semiconductor measurement apparatus includes an illumination unit including a light source and at least one illumination polarization element, a light receiving unit including at least one light-receiving polarization element disposed on ...