US Patent Issued to SAMSUNG ELECTRONICS on Oct. 28 for "Logic BIST circuit and semiconductor device including same" (South Korean Inventors)

ALEXANDRIA, Va., Oct. 28 -- United States Patent no. 12,455,317, issued on Oct. 28, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea).

"Logic BIST circuit and semiconductor device including same" was invented by Sangsoon Im (Suwon-si, South Korea) and Sungcheol Park (Suwon-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided are a logic built-in self-test (BIST) circuit that performs a scan test improving test coverage for each clock domain and a semiconductor device including the logic BIST circuit. The logic BIST circuit includes an OR gate configured to receive a scan enable signal and a register setting signal, and generate a modified scan enable signal; a clock gati...