ALEXANDRIA, Va., Oct. 28 -- United States Patent no. 12,446,833, issued on Oct. 21, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea).
"Method for predicting failure of bio-information estimation and apparatus for estimating bio-information" was invented by Seung Keun Yoon (Seoul, South Korea), Ui Kun Kwon (Hwaseong-si, South Korea) and Dae Geun Jang (Yongin-si, South Korea).
According to the abstract* released by the U.S. Patent & Trademark Office: "A method for predicting failure of bio-information estimation is provided. The method for predicting failure of bio-information estimation includes: receiving a bio-signal; obtaining failure prediction indicators from the bio-signal that is received until a current time, th...