US Patent Issued to SAMSUNG ELECTRONICS on Oct. 14 for "Test devices and systems that utilize efficient test algorithms to evaluate devices under test" (South Korean Inventors)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,442,842, issued on Oct. 14, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (South Korea).

"Test devices and systems that utilize efficient test algorithms to evaluate devices under test" was invented by Jungmin Bak (Suwon-si, South Korea), Junyoung Ko (Suwon-si, South Korea) and Changhwi Park (Suwon-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A test device includes a power supply circuit that is configured to supply an input voltage through a power voltage pin to a memory device under test, and a test controller, which is configured to: (i) transmit a command signal to the memory device, (ii) measure a first current flowing to the memor...