US Patent Issued to SAMSUNG ELECTRONICS on Oct. 14 for "Sample holder of transmission electron microscope and semiconductor device inspection method using the sample holder" (South Korean Inventors)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,444,568, issued on Oct. 14, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea).

"Sample holder of transmission electron microscope and semiconductor device inspection method using the sample holder" was invented by Yeoseon Choi (Suwon-si, South Korea) and Donghoon Kwon (Suwon-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A sample holder includes a head, a first holding plate extending in a first direction from one surface of the head and including at least one first sample hole configured to accommodate at least one first sample and a first main surface configured such that the at least one first sample accommodated in...