US Patent Issued to SAMSUNG ELECTRONICS on Nov. 4 for "Test device and test system for semiconductor devices" (South Korean Inventors)

ALEXANDRIA, Va., Nov. 6 -- United States Patent no. 12,461,139, issued on Nov. 4, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea).

"Test device and test system for semiconductor devices" was invented by Seong Seob Shin (Suwon-si, South Korea), Soon Il Kwon (Suwon-si, South Korea), Soo Yong Park (Suwon-si, South Korea) and Tae-Hwan Kim (Suwon-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A test device includes a main board. First and second device under test (DUT) boards are disposed on the main board. First and second semiconductor devices are mounted on the first and second DUT boards, respectively. The first and second semiconductor devices are DUTs. First and second c...