ALEXANDRIA, Va., Nov. 18 -- United States Patent no. 12,474,843, issued on Nov. 18, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (South Korea).
"Determining exposure temperatures" was invented by Seohyun Shin (Suwon-si, South Korea), Kyungduk Lee (Suwon-si, South Korea) and Sanghwa Jin (Suwon-si, South Korea).
According to the abstract* released by the U.S. Patent & Trademark Office: "A method of providing an exposure temperature includes generating reference information indicating relationships between an exposure condition and a retention value, where the exposure condition include an exposure temperature and an exposure time of a nonvolatile memory device and the retention value indicates retention characteristic of the nonvolatile mem...