US Patent Issued to SAMSUNG ELECTRONICS on May 27 for "Pressurizing device for semiconductor testing and semiconductor test device including the same" (South Korean Inventors)

ALEXANDRIA, Va., June 17 -- United States Patent no. 12,313,677, issued on May 27, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea).

"Pressurizing device for semiconductor testing and semiconductor test device including the same" was invented by Changgeun Yang (Hwaseong-si, South Korea), Youbi Kim (Uijeongbu-si, South Korea), Sanghun Lee (Hwaseong-si, South Korea) and Sangsik Lee (Suwon-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A pressurizing device for semiconductor testing includes a tension block, a first pusher block extending through the tension block, a base plate on the first pusher block, a second pusher block on the tension block and extending through the bas...