US Patent Issued to SAMSUNG ELECTRONICS on May 20 for "Image sensor test system including operational amplifier and low-frequency attenuator" (South Korean Inventors)

ALEXANDRIA, Va., June 16 -- United States Patent no. 12,309,353, issued on May 20, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea).

"Image sensor test system including operational amplifier and low-frequency attenuator" was invented by Seongkwan Lee (Suwon-si, South Korea), Minho Kang (Suwon-si, South Korea), Cheolmin Park (Suwon-si, South Korea), Hyungsun Ryu (Suwon-si, South Korea) and Jaemoo Choi (Suwon-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "An image sensor test system includes a test device configured to transmit an input signal and a control signal to at least one image sensor through a probe card, and an interface board configured to map the probe card and t...