US Patent Issued to SAMSUNG ELECTRONICS on May 13 for "Method and device for predicting defects" (South Korean Inventors)

ALEXANDRIA, Va., June 12 -- United States Patent no. 12,298,749, issued on May 13, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea).

"Method and device for predicting defects" was invented by Taelim Choi (Seoul, South Korea) and Jun Haeng Lee (Hwaseong-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method and device for predicting a defect. The method includes determining a sequence between a plurality of sub-models by modeling a production process into the plurality of sub-models, mapping production process data into each of the plurality of sub-models, determining, by a corresponding sub-model, output data comprising defect information on a potential defect occurring i...