US Patent Issued to SAMSUNG ELECTRONICS on March 25 for "Systems and methods for predicting storage device failure using machine learning" (California Inventors)

ALEXANDRIA, Va., March 26 -- United States Patent no. 12,260,347, issued on March 25, was assigned to SAMSUNG ELECTRONICS Co. LTD. (South Korea).

"Systems and methods for predicting storage device failure using machine learning" was invented by Qinling Zheng (San Jose, Calif.), Nima Elyasi (San Jose, Calif.), Vikas Sinha (Sunnyvale, Calif.) and Changho Choi (San Jose, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for predicting a time-to-failure of a target storage device may include training a machine learning scheme with a time-series dataset, and applying the telemetry data from the target storage device to the machine learning scheme which may output a time-window based time-to-failure p...