US Patent Issued to SAMSUNG ELECTRONICS on March 11 for "Semiconductor chip and test method of the same" (South Korean Inventors)

ALEXANDRIA, Va., March 12 -- United States Patent no. 12,248,018, issued on March 11, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (South Korea).

"Semiconductor chip and test method of the same" was invented by Yeon Ho Jung (Suwon-si, South Korea), Jong Wook Kye (Suwon-si, South Korea), Min Woo Kwak (Seoul, South Korea), Mi Joung Kim (Hwaseong-si, South Korea), Chan Wook Park (Seongnam-si, South Korea), Do Hoon Byun (Hwaseong-si, South Korea), Kwan Seong Lee (Yongin-si, South Korea), Jae Ho Lee (Incheon, South Korea), Jae Seung Choi (Hwaseong-si, South Korea) and Hwang Ho Choi (Busan, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A semiconductor chip includes a semiconductor device connected bet...