US Patent Issued to SAMSUNG ELECTRONICS on June 3 for "Data storage device for checking a defect of row lines and an operation method thereof" (South Korean Inventors)

ALEXANDRIA, Va., June 4 -- United States Patent no. 12,322,464, issued on June 3, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea).

"Data storage device for checking a defect of row lines and an operation method thereof" was invented by Kyungduk Lee (Suwon-si, South Korea), Ho-Sung Ahn (Suwon-si, South Korea) and Youn-Soo Cheon (Suwon-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A data storage device including: a memory device including a plurality of memory blocks; and a memory controller configured to control the memory device, wherein the plurality of memory blocks are connected with row lines, wherein the row lines include word lines, wherein the memory controller is...