ALEXANDRIA, Va., June 4 -- United States Patent no. 12,318,223, issued on June 3, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea).
"Apparatus and method for measuring biometric information" was invented by Jae Min Kang (Seoul, South Korea), Yong Joo Kwon (Yongin-si, South Korea), Seung Woo Noh (Seongnam-si, South Korea) and Sang Yun Park (Hwaseong-si, South Korea).
According to the abstract* released by the U.S. Patent & Trademark Office: "An apparatus for measuring biometric information is provided. The apparatus may include: a main body configured to be worn on an object to be examined. The main body may include a contact pressure sensor configured to measure a contact pressure of the object while a hand shape is ch...