US Patent Issued to Samsung Electronics on June 24 for "Method and device for configuration of minimization of drive tests" (Chinese Inventors)

ALEXANDRIA, Va., June 25 -- United States Patent no. 12,342,206, issued on June 24, was assigned to Samsung Electronics Co. Ltd (South Korea).

"Method and device for configuration of minimization of drive tests" was invented by Hong Wang (Beijing), Lixiang Xu (Beijing) and Weiwei Wang (Beijing).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure provides a method and device for configuration of minimization of drive tests, in which a first node sends MDT status information to a second node; and the second node decides whether it is possible to configure a management-based logged MDT measurement for a UE. It is avoided that the MDT configuration information that is currently still valid is er...