US Patent Issued to SAMSUNG ELECTRONICS on June 24 for "Measuring apparatus and testing apparatus having the same" (South Korean, Japanese Inventors)

ALEXANDRIA, Va., June 25 -- United States Patent no. 12,339,223, issued on June 24, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Gyeonggi-Do, South Korea).

"Measuring apparatus and testing apparatus having the same" was invented by Yasuhiro Hidaka (Yokohama, Japan) and Ingi Kim (Suwon-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A measuring apparatus includes a first beam splitter, a diffraction grating, an optical illumination system, an optical condensing system configured to condense an electromagnetic wave EH radiated from the specimen, a time domain detector configured to detect the electromagnetic wave EH, for each time when the trigger beam, light path length of which has been chang...