US Patent Issued to SAMSUNG ELECTRONICS on June 17 for "Operating and testing semiconductor devices" (South Korean Inventors)

ALEXANDRIA, Va., June 19 -- United States Patent no. 12,334,170, issued on June 17, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (South Korea).

"Operating and testing semiconductor devices" was invented by Taewook Park (Suwon-si, South Korea), Eunhye Oh (Suwon-si, South Korea), Jisu Kang (Suwon-si, South Korea) and Yongki Lee (Suwon-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "An operation method of a memory device includes programming a test pattern in a normal area, obtaining locations of error bits with respect to the test pattern and an error count for each error bit location, and repairing faulty cells included in the normal area with redundancy cells in a redundancy area based on the ...