US Patent Issued to SAMSUNG ELECTRONICS on June 17 for "Electronic device for detecting defect in image on basis of difference among sub-images acquired by multiple photodiode sensors, and operation method thereof" (South Korean Inventors)

ALEXANDRIA, Va., June 19 -- United States Patent no. 12,333,696, issued on June 17, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea).

"Electronic device for detecting defect in image on basis of difference among sub-images acquired by multiple photodiode sensors, and operation method thereof" was invented by Jeongwon Lee (Suwon-si, South Korea), Eunho Kim (Suwon-si, South Korea), Changgon Kim (Suwon-si, South Korea), Jaecheol Bae (Suwon-si, South Korea), Hongseok Yang (Suwon-si, South Korea) and Sanghwan Jeong (Suwon-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "An electronic device is provided. The electronic device includes a memory, an image sensor including light rece...