ALEXANDRIA, Va., June 19 -- United States Patent no. 12,332,200, issued on June 17, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea).

"Apparatus and method with electrode-based measurement" was invented by Hyeokki Hong (Suwon-si, South Korea), Chisung Bae (Suwon-si, South Korea) and Kitae Park (Suwon-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A measuring apparatus implementing an electrode array and an operating method of the measuring apparatus are provided. The measuring apparatus may include an electrode array configured to measure input signals of an analog domain through electrodes arranged in a target point, main signal processors configured to perform signal pro...