ALEXANDRIA, Va., June 18 -- United States Patent no. 12,327,579, issued on June 10, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Gyeonggi-Do, South Korea).
"Inspection device" was invented by Shinji Ueyama (Yokohama, Japan), Ingi Kim (Suwon-si, South Korea), Harutaka Sekiya (Yokohama, Japan) and Tomoki Onishi (Yokohama, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "To reduce a measurement time, an inspection device includes a stage configured to fix a magnetoresistive random access memory (MRAM) to a stage surface and moving the MRAM, a plurality of magnets configured to generate a gradient magnetic, a plurality of line sensors comprising a first line sensor for detecting a magneto-optical effect at ...