ALEXANDRIA, Va., July 9 -- United States Patent no. 12,350,013, issued on July 8, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea).

"Spectrometer including tunable on-chip laser and spectrum measurement method" was invented by Alexey Dmitrievich Lantsov (Lobnya, Russia), Alexey Andreevich Shchekin (Moscow), Sergey Nikolaevich Koptyaev (N.Tagil, Russia), Alexey Grigorievich Anikanov (Moscow), Maksim Vladimirovich Ryabko (Dolgoprudny, Russia), Pavel Alexandrovich Ivshin (Balashiha, Russia), Vasiliy Viktorovich Grigoriev (Moscow) and Tatyana Igorevna Kopysova (Perm, Russia).

According to the abstract* released by the U.S. Patent & Trademark Office: "A spectrometer may include: a tunable on-chip laser source configured to ...