US Patent Issued to SAMSUNG ELECTRONICS on July 22 for "Memory device including test pad connection circuit" (South Korean Inventors)

ALEXANDRIA, Va., July 23 -- United States Patent no. 12,367,944, issued on July 22, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Gyeonggi-Do, South Korea).

"Memory device including test pad connection circuit" was invented by Chang-Wook Seo (Suwon-si, South Korea), Sangyong Yoon (Suwon-si, South Korea) and Keeho Jung (Suwon-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A memory device includes a test mode detector circuit that determines whether the memory device has entered a test mode based on at least one test mode entry signal received through at least one pin of a plurality of pins and generates a test mode detection signal, and a test pad connection circuit that electrically couples a...