US Patent Issued to SAMSUNG ELECTRONICS on July 15 for "Semiconductor inspection apparatus and semiconductor inspection method using the same" (South Korean Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,362,139, issued on July 15, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea).

"Semiconductor inspection apparatus and semiconductor inspection method using the same" was invented by Yujin Cho (Hwaseong-si, South Korea), Jonghyuk Kang (Seoul, South Korea), Inhye Park (Seoul, South Korea), Suyoung Lee (Seongnam-si, South Korea), Chungsam Jun (Suwon-si, South Korea), Hongche Noh (Seoul, South Korea) and Janghee Lee (Seoul, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed are semiconductor inspection apparatuses and methods. The semiconductor inspection apparatus comprises a stage that supports a semiconductor device,...