US Patent Issued to SAMSUNG ELECTRONICS on July 15 for "Method of calculating thickness of graphene layer and method of measuring content of silicon carbide by using XPS" (South Korean Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,359,911, issued on July 15, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Gyeonggi-Do, South Korea).

"Method of calculating thickness of graphene layer and method of measuring content of silicon carbide by using XPS" was invented by Eunkyu Lee (Yongin-si, South Korea), Yeonchoo Cho (Seongnam-si, South Korea), Sangwon Kim (Seoul, South Korea), Kyung-Eun Byun (Seongnam-si, South Korea), Hyunjae Song (Hwaseong-si, South Korea) and Hyeonjin Shin (Suwon-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method of calculating a thickness of a graphene layer and a method of measuring a content of silicon carbide, by using X-ray photoelectron spec...