US Patent Issued to SAMSUNG ELECTRONICS on July 1 for "Storage devices detecting internal temperature and defects by using temperature sensors and methods of operating the same" (South Korean Inventors)

ALEXANDRIA, Va., July 3 -- United States Patent no. 12,347,514, issued on July 1, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (South Korea).

"Storage devices detecting internal temperature and defects by using temperature sensors and methods of operating the same" was invented by Younsoo Cheon (Suwon-si, South Korea), Jihwa Lee (Suwon-si, South Korea) and Kyungduk Lee (Suwon-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A storage device including a non-volatile memory for storing data, a temperature sensor having resistance that changes according to temperature of the temperature sensor, and a temperature measurement circuit including a plurality of transistors, which are turned on or off b...