ALEXANDRIA, Va., July 3 -- United States Patent no. 12,347,096, issued on July 1, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Gyeonggi-do, South Korea).
"Semiconductor measurement apparatus" was invented by Myungjun Lee (Seongnam-si, South Korea), Jinseob Kim (Suwon-si, South Korea), Wookrae Kim (Suwon-si, South Korea), Jinyong Kim (Suwon-si, South Korea), Jaehwang Jung (Suwon-si, South Korea) and Sungho Jang (Yongin-si, South Korea).
According to the abstract* released by the U.S. Patent & Trademark Office: "A semiconductor measurement device may include an illumination apparatus having a polarizer on a propagation path of light output from a light source; an optical assembly including an objective lens configured to allow light passin...