US Patent Issued to SAMSUNG ELECTRONICS on July 1 for "Built-in self-test circuit and temperature measurement circuit including the same" (South Korean Inventors)

ALEXANDRIA, Va., July 3 -- United States Patent no. 12,345,762, issued on July 1, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (South Korea).

"Built-in self-test circuit and temperature measurement circuit including the same" was invented by Junhee Shin (Yongin-Si, South Korea), Jooseong Kim (Seoul, South Korea), Yongjin Lee (Goyang-si, South Korea), Michael Choi (Seoul, South Korea), Kwangho Kim (Yongin-si, South Korea) and Sangho Kim (Suwon-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A temperature measurement circuit includes a band-gap reference circuit configured to generate a band-gap reference voltage that is fixed regardless of an operation temperature, a reference voltage generator...