ALEXANDRIA, Va., Jan. 29 -- United States Patent no. 12,210,059, issued on Jan. 28, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Gyeonggi-do, South Korea).
"Test element group and test method" was invented by Jeongha Kim (Hwaseong-si, South Korea), Dongsoo Kang (Seongnam-si, South Korea) and Jaeboong Lee (Yongin-si, South Korea).
According to the abstract* released by the U.S. Patent & Trademark Office: "A test element group (TEG) disposed adjacent to at least one memory chip on a wafer includes a ring oscillator configured to output a clock signal based on a direct current (DC) signal received through a first pad and from a test device, a first divider configured to divide the clock signal and to output a first divided signal, and a seq...