ALEXANDRIA, Va., Jan. 13 -- United States Patent no. 12,523,566, issued on Jan. 13, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea).
"Optical measurement apparatus" was invented by Seung Ryeol Lee (Suwon-si, South Korea), Ye Eun Park (Suwon-si, South Korea), Jin Woo Ahn (Suwon-si, South Korea), Seung Woo Lee (Suwon-si, South Korea), Tae Joong Kim (Suwon-si, South Korea) and Myung Jun Lee (Suwon-si, South Korea).
According to the abstract* released by the U.S. Patent & Trademark Office: "Provided is an optical measurement apparatus. The optical measurement apparatus includes a light source; an objective lens; a reflector configured to change an optical path of light emitted from the light source such that the light is ...