US Patent Issued to SAMSUNG ELECTRONICS on Jan. 13 for "Measuring apparatus for semiconductor device and measuring method using the same" (South Korean Inventors)

ALEXANDRIA, Va., Jan. 13 -- United States Patent no. 12,523,696, issued on Jan. 13, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea).

"Measuring apparatus for semiconductor device and measuring method using the same" was invented by Jinhyuk Choi (Suwon-si, South Korea), Sumin Park (Suwon-si, South Korea), Myungki Song (Suwon-si, South Korea), Kongwoo Lee (Suwon-si, South Korea), Kyusang Lee (Suwon-si, South Korea), Beomsoo Hwang (Suwon-si, South Korea) and Jayul Kim (Suwon-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A measuring apparatus for a semiconductor device includes a lower frame that provides a lower measurement space configured for performing a first measuremen...