ALEXANDRIA, Va., Feb. 3 -- United States Patent no. 12,541,411, issued on Feb. 3, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea).
"Failure prediction apparatus and method for storage devices" was invented by Wenwen Hao (Suwon-si, South Korea), Yuqi Zhang (Suwon-si, South Korea), Chankyu Koh (Suwon-si, South Korea) and Yongwong Kwon (Suwon-si, South Korea).
According to the abstract* released by the U.S. Patent & Trademark Office: "A failure prediction apparatus and method for storage devices are provided, the method including: obtaining attribute information of a plurality of attributes for a plurality of storage devices during operation of a storage apparatus; obtaining global attribute information for each of the p...