US Patent Issued to SAMSUNG ELECTRONICS on Feb. 18 for "Super resolution SEM image implementing device and method thereof" (South Korean Inventors)

ALEXANDRIA, Va., Feb. 19 -- United States Patent no. 12,229,936, issued on Feb. 18, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Gyeonggi-do, South Korea).

"Super resolution SEM image implementing device and method thereof" was invented by Ho Joon Lee (Goyang-si, South Korea), Il Kwon Kim (Hwaseong-si, South Korea), Sang Gul Park (Hwaseong-si, South Korea), Chang Wook Jeong (Hwaseong-si, South Korea), Moon Hyun Cha (Yongin-si, South Korea) and Sat Byul Kim (Seoul, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "Some example embodiments relate to a super resolution scanning electron microscope (SEM) image implementing device and/or a method thereof. Provided a super resolution scanning electron mi...