US Patent Issued to SAMSUNG ELECTRONICS on Feb. 18 for "Built-in self-test circuits for memory systems having multiple channels" (South Korean Inventors)

ALEXANDRIA, Va., Feb. 19 -- United States Patent no. 12,230,345, issued on Feb. 18, was assigned to SAMSUNG ELECTRONICS Co. LTD. (South Korea).

"Built-in self-test circuits for memory systems having multiple channels" was invented by Jaewon Park (Suwon-si, South Korea) and Shinhaeng Kang (Suwon-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A memory system includes a plurality of memory devices having respective arrays of memory cells therein, a bus electrically coupled to and shared by the plurality of memory devices, and a memory controller. The memory controller, which is electrically coupled to the bus, includes a built-in self-test (BIST) circuit, which is commonly connected to the plura...