US Patent Issued to SAMSUNG ELECTRONICS on Feb. 10 for "Method for reporting and configuring MDT measurement, apparatus and electronic device using the same and medium" (Chinese Inventors)

ALEXANDRIA, Va., Feb. 11 -- United States Patent no. 12,549,983, issued on Feb. 10, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea).

"Method for reporting and configuring MDT measurement, apparatus and electronic device using the same and medium" was invented by Hong Wang (Beijing), Lixiang Xu (Beijing) and Weiwei Wang (Beijing).

According to the abstract* released by the U.S. Patent & Trademark Office: "The embodiment of the present disclosure provides a method for reporting and configuring MDT measurement, apparatus and electronic device using the same and medium. The method may be performed by a first access network node and includes: obtaining first MDT configuration information; performing MDT measurement accordi...