ALEXANDRIA, Va., Dec. 31 -- United States Patent no. 12,511,207, issued on Dec. 30, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea).
"Storage device and method of testing storage device" was invented by Wonchol Kim (Suwon-si, South Korea), Jaegyu Choi (Suwon-si, South Korea), Tae-Yong Kim (Suwon-si, South Korea) and Jiwon Park (Suwon-si, South Korea).
According to the abstract* released by the U.S. Patent & Trademark Office: "A storage device including: a nonvolatile memory; and a controller configured to control the nonvolatile memory, wherein the controller is configured to: obtain authority to access an external memory, wherein the external memory is allocated by an external host device; receive a test scenario, wh...