US Patent Issued to SAMSUNG ELECTRONICS on Dec. 2 for "Test apparatus and test method for detecting defects of elements included in integrated circuit" (South Korean Inventors)

ALEXANDRIA, Va., Dec. 2 -- United States Patent no. 12,489,431, issued on Dec. 2, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (South Korea).

"Test apparatus and test method for detecting defects of elements included in integrated circuit" was invented by Seonghoon Park (Suwon-si, South Korea) and Hyoun Soo Park (Suwon-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A test apparatus includes an input terminal, a first multiplexer, a plurality of first elements connected in series between the input terminal and the first multiplexer, and a processor. The first multiplexer is connected to each of a plurality of nodes between the plurality of first elements, and the processor is connected to the ...