ALEXANDRIA, Va., Dec. 16 -- United States Patent no. 12,501,333, issued on Dec. 16, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea).
"Measurement and cell reselection in a NTN" was invented by Kyeongin Jeong (Allen, Texas).
According to the abstract* released by the U.S. Patent & Trademark Office: "Methods and apparatuses for measurement and cell reselection in NTN. A method of operating a UE comprises: determining, based on a first threshold and a second threshold, whether a first condition is satisfied; determining, based on a third threshold, whether a second condition is satisfied; and skipping measurement operations on neighboring cells in a NTN based on a determination that the first condition and the second con...