US Patent Issued to SAMSUNG ELECTRONICS on Dec. 16 for "Built-in-self-test logic, memory device with same, and memory module testing method" (South Korean Inventors)

ALEXANDRIA, Va., Dec. 16 -- United States Patent no. 12,499,961, issued on Dec. 16, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea).

"Built-in-self-test logic, memory device with same, and memory module testing method" was invented by Eunhye Oh (Suwon-si, South Korea), Jaehyeok Kim (Seoul, South Korea), Yong Ki Lee (Suwon-si, South Korea), Gapkyoung Kim (Suwon-si, South Korea) and Taewook Park (Suwon-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A memory device includes a memory module and a BIST logic circuit. The BIST logic circuit includes; a pattern generator configured to generate first main data including a first portion, an error correction code (ECC) encoder conf...