ALEXANDRIA, Va., Aug. 6 -- United States Patent no. 12,380,008, issued on Aug. 5, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea).
"Memory test drive" was invented by U Kang (Seoul, South Korea), Su Hyun Chae (Suwon-si, South Korea), Jong Min Park (Suwon-si, South Korea), Jun-Gi Jang (Seoul, South Korea), Ji Yong Lee (Suwon-si, South Korea), Sooyeon Shim (Seoul, South Korea) and Vladimir Vladimirovich Egay (Seoul, South Korea).
According to the abstract* released by the U.S. Patent & Trademark Office: "A memory test device is provided including a command feature vector extractor and an address feature vector extractor. The command feature vector extractor extracts a command feature vector, based commands executed on m...