US Patent Issued to SAMSUNG ELECTRONICS on Aug. 26 for "Test element group and test device including the same" (South Korean Inventors)

ALEXANDRIA, Va., Aug. 26 -- United States Patent no. 12,399,212, issued on Aug. 26, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea).

"Test element group and test device including the same" was invented by Sunwoo Kim (Ansan-si, South Korea), Minseob Kim (Suwon-si, South Korea) and Juhyun Kim (Yongin-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A test device includes semiconductor substrate, gate lines disposed on an upper surface of the semiconductor substrate and extending in a first direction parallel to the upper surface, a test element group including test transistors defined by the gate lines and by active regions extending in a second direction perpendicular to the...