US Patent Issued to SAMSUNG ELECTRONICS on Aug. 19 for "TEG circuit, semiconductor device, and test method of the TEG circuit" (South Korean Inventors)

ALEXANDRIA, Va., Aug. 20 -- United States Patent no. 12,392,814, issued on Aug. 19, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea).

"TEG circuit, semiconductor device, and test method of the TEG circuit" was invented by Cheongwon Lee (Suwon-si, South Korea), Gyosoo Choo (Suwon-si, South Korea), Youngwoo Park (Suwon-si, South Korea), Seunghoon Lee (Suwon-si, South Korea) and Jinwoo Choi (Suwon-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "An embodiment provides a test element group (TEG) circuit, including: a first pad configured for a test voltage to be applied; an amplifier including a first input terminal connected to the first pad, a second input terminal connected t...