US Patent Issued to SAMSUNG ELECTRONICS on April 1 for "Memory device and test method of memory device" (South Korean Inventors)

ALEXANDRIA, Va., April 2 -- United States Patent no. 12,266,414, issued on April 1, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (South Korea).

"Memory device and test method of memory device" was invented by Jaewon Park (Suwon-si, South Korea) and Sukhan Lee (Suwon-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided is a memory device including a cell array, a peripheral circuit configured to control a memory operation of the plurality of memory cells, a test logic circuit configured to operate in a test mode and configured to perform a test operation on the plurality of memory cells, a first regulator configured to regulate a first power supply voltage received through a first pad and p...