US Patent Issued to SAMSUNG ELECTRONICS, RESEARCH & BUSINESS FOUNDATION SUNGKYUNKWAN UNIVERSITY on Sept. 23 for "Fine dust mass measurement device and operating method thereof" (South Korean Inventors)

ALEXANDRIA, Va., Sept. 23 -- United States Patent no. 12,422,405, issued on Sept. 23, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea) and RESEARCH & BUSINESS FOUNDATION SUNGKYUNKWAN UNIVERSITY (Suwon-si, South Korea).

"Fine dust mass measurement device and operating method thereof" was invented by Ilhwan Kim (Suwon-si, South Korea), Changhyeon Kim (Suwon-si, South Korea) and Kangyoon Lee (Seoul, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A dust mass measurement device includes a sensing channel configured to generate a sensing clock signal, a reference channel configured to generate a reference clock signal, a counter configured to generate a first output signal based on ...