US Patent Issued to SAMSUNG ELECTRONICS, Research & Business Foundation Sungkyunkwan University on Dec. 2 for "Scan flip-flop, scan chain circuit including the same, and control method of the scan flip-flop" (South Korean Inventors)

ALEXANDRIA, Va., Dec. 2 -- United States Patent no. 12,487,285, issued on Dec. 2, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea) and Research & Business Foundation Sungkyunkwan University (Suwon-si, South Korea).

"Scan flip-flop, scan chain circuit including the same, and control method of the scan flip-flop" was invented by Changyoun Im (Suwon-si, South Korea) and Yoonmyung Lee (Suwon-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A scan flip-flop configured to generate physically unclonable function (PUF) data according to the present disclosure includes a multiplexer configured to provide an internal signal through an input switch, a first latch circuit configured to ...