US Patent Issued to SAMSUNG ELECTRONICS, KOREA ADVANCED INSTITUTE OF SCIENCE AND Technology on Aug. 12 for "Method of inspecting tip of atomic force microscope and method of manufacturing semiconductor device" (South Korean Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,385,946, issued on Aug. 12, was assigned to SAMSUNG ELECTRONICS Co. LTD. and KOREA ADVANCED INSTITUTE OF SCIENCE AND Technology (Daejeon, South Korea).

"Method of inspecting tip of atomic force microscope and method of manufacturing semiconductor device" was invented by Kwangeun Kim (Suwon-si, South Korea), Seungbum Hong (Daejeon, South Korea), Sungyoon Ryu (Seoul, South Korea), Hoon Kim (Daejeon, South Korea), Jiwon Yeom (Daejeon, South Korea), Seokjung Yun (Daejeon, South Korea), Souk Kim (Seoul, South Korea), Younghoon Sohn (Seoul, South Korea) and Yusin Yang (Seoul, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method of operating an ...