ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,429,720, issued on Sept. 30, was assigned to Samsung Display Co. Ltd. (Yongin-si, South Korea).
"Method of inspecting display substrate" was invented by Kwang Taek Hong (Yongin-si, South Korea), Jun Yeong Park (Yongin-si, South Korea) and Hwa Sung Woo (Yongin-si, South Korea).
According to the abstract* released by the U.S. Patent & Trademark Office: "A method of inspecting a display substrate including pixel patterns provided in pixel areas disposed in a display area in a first direction and a second direction may include obtaining a captured image of the pixel patterns of the display substrate, grouping pixels included in the captured image by grouping at least two pixels disposed...