US Patent Issued to SAMSUNG DISPLAY on Sept. 16 for "Method of inspecting image quality, image quality inspection system performing the same, and display device to which the same is applied" (South Korean Inventors)

ALEXANDRIA, Va., Sept. 17 -- United States Patent no. 12,418,623, issued on Sept. 16, was assigned to SAMSUNG DISPLAY Co. LTD. (Gyeonggi-Do, South Korea).

"Method of inspecting image quality, image quality inspection system performing the same, and display device to which the same is applied" was invented by Sunyoung Park (Yongin-si, South Korea), Kyongtae Park (Yongin-si, South Korea) and Youngnam Yun (Yongin-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method of inspecting image quality includes receiving a non-moire image generated by a simulator and a moire image generated by the simulator based on the non-moire image, training a moire removal deep learning model for converting the mo...