US Patent Issued to SAMSUNG DISPLAY on Oct. 7 for "Substrate inspection device and substrate inspection method using the same" (South Korean Inventors)

ALEXANDRIA, Va., Oct. 8 -- United States Patent no. 12,436,109, issued on Oct. 7, was assigned to SAMSUNG DISPLAY Co. LTD. (Gyeonggi-Do, South Korea).

"Substrate inspection device and substrate inspection method using the same" was invented by Sung Hune Yoo (Yongin-si, South Korea) and Dongwook Lee (Yongin-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A substrate inspection device includes an imaging part that is disposed in a chamber and obtains an input image by photographing a substrate coated with a solution, and an analysis part that converts brightness data of the input image into grayscale data and analyzes a film shape of a pixel region based on the grayscale data."

The patent was f...